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Nikon 2S005-253 300mm Wafer AFCCD Optical Inspection Sensor NRM-3100 Working Model No: BEAMLINE INSTRUMENTATION M/BD

SKU: 20958317412

4.6
USD2254.11 USD2291.11

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Ships within 48 hours · Estimated delivery Jul 26 - Jul 31

Description

Model No: BEAMLINE INSTRUMENTATION M/BD

03-252223-00

2 Used Working

Part No: 455-60-16

5010-405340-11 BRACKET (Qty

Nikon 2S005-253 300mm Wafer AFCCD Optical Inspection Sensor NRM-3100 Working Model No: BEAMLINE INSTRUMENTATION M/BDNikon 2S005 253 300mm Wafer AFCCD Optical Inspection Sensor NRM 3100 Working Inventory # 21275 Part No: 2S005 253 Model No: AFCCD Removed from a Nikon NRM 3100 300mm Wafer Overlay Measurement System Made in Japan This Nikon 2S005 253 300mm Wafer AFCCD Optical Inspection Sensor is used working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Used Working, 90 Day Warranty Estimated

Exchange/Return Notes
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  • Final sale items are not eligible for returns or exchanges.
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